Evenementen Industrial Metrology

ZEISS Innovation Day: Surface Finish Metrology

Datum

10/10/2018

Plaats

USA / Dayton, OH

This informative session will cover how to deal with the R parameters pertaining to surface roughness, including averaging, Peak to Valley, Slope, Spacing, Counting and Bearing Area Curve.  Industry expert, Mark C. Malburg, Ph.D. will lead this session.